STEM-ACOM / Nanobeam diffraction mapping
Nanoscale Microstructural Analysis by STEM Automated Crystal Orientation Mapping
STEM-ACOM (Automated Crystal Orientation Mapping) is a method that scans a finely focused electron beam in a TEM and analyzes crystal orientation and phase from electron diffraction patterns acquired at each point. It is effective for local orientation analysis of microstructures, thin films, nanocrystals, and heavily deformed materials where EBSD lacks sufficient spatial resolution. Our laboratory analyzes nanoscale texture, grain boundaries, and orientation distributions in superconducting thin films, drawn pearlitic steels, magnetic thin films, and related materials.
Key Points
Nanoscale orientation mapping
We visualize the orientation distribution of fine grains and columnar structures using nanometer-scale electron diffraction data.
Linking texture to functional properties
We quantitatively evaluate crystal orientations that govern functional properties, such as c-axis texture and low-angle grain-boundary networks in superconducting thin films.
Applications to heavily deformed materials and thin films
We apply this approach to nanostructures that are difficult to analyze by conventional methods, including drawn pearlitic steel and FePt-C thin films.
Related Publications and Information
Selected publications and related information on this topic are listed below.