Shared Use of Electron Microscopes
Our laboratory uses advanced research facilities, especially electron microscopes operated by the Faculty of Engineering Sciences, to conduct nanostructural analysis of materials. Please contact Prof. Hata if you are interested in shared use of the facilities listed below.
Please click here to view the usage rules.
An introductory video of the shared electron microscopy facility is available on YouTube (July 17, 2020).
Transmission Electron Microscopes (TEM)
JEOL JEM-ARM200F
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- High-resolution scanning transmission electron microscopy
- Energy-dispersive X-ray spectroscopy (EDS)
- Lattice-strain mapping using nanobeam electron diffraction
- Scanning precession electron diffraction (SPED)
FEI(ThermoFisher) Titan cubed G2
- High-resolution scanning transmission electron microscopy
- Electron tomography (3D-ET)
- Energy-dispersive X-ray spectroscopy (EDS)
- Electron energy-loss spectroscopy (EELS)
TEM Specimen Holders
- High-angle three-axis holder
- High-tilt cooling holder for liquid nitrogen
- Double-tilt cooling holder for liquid nitrogen
- High-tilt cartridge-type straining holder
- Double-tilt MEMS-chip heating holder
Many of our special specimen holders were jointly developed withMel-Build Co.(Fukuoka).
Focused Ion Beam–Scanning Electron Microscopes (FIB-SEM)
FEI(ThermoFisher) Helios 5 Hydra CX
- Plasma ion beam sources (Xe, Ar, O, N)
- Energy dispersive X-ray spectroscopy
- Electron backscattered diffraction analysis
- Time-of-flight secondary ion mass spectrometry (TOF-SIMS)
- Vacuum transfer system from a glove box
FEI(ThermoFisher) Scios
- Ga ion beam
- Energy dispersive X-ray spectroscopy
- Electron backscattered diffraction analysis
- Cooling stage
FEI(ThermoFisher) Versa 3D
- Ga ion beam