Electron tomography / 3D and 4D characterization
Three-Dimensional Nanostructural Characterization of Crystalline Materials by Electron Tomography
TEM and STEM images are usually obtained as two-dimensional projections through thin specimens. However, nanostructures such as dislocations, interfaces, precipitates, and grain boundaries are inherently three-dimensional, and 2D images alone may not correctly reveal overlap or depth information. Our laboratory combines electron tomography, diffraction contrast, deep learning, and in-situ electron microscopy to analyze static and dynamic three-dimensional structures in crystalline materials.
Key Points
Three-dimensional visualization of dislocations and interfaces
We capture lattice defects in steels and nonferrous metals as three-dimensional structures rather than projected images.
Integration with in-situ observation
We continuously observe microstructural changes during heating and deformation and extend the approach to 4D analysis including the time axis.
Development of characterization methods
We expand the limits of observation using high-tilt holders, diffraction-contrast tomography, compressed sensing, deep learning, and related techniques.
Related Publications and Information
Selected publications and related information on this topic are listed below.